XOS Etnom film, 200335-02
XOS - X-Ray Optical Systems -- Item TECPIM000153559
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The XOS Etnom film analysis system model 200335-02 by X-Ray Optical Systems is a cutting-edge instrument designed for high-precision analysis of thin films. It offers advanced capabilities for accurate measurement of layer thickness, composition analysis, and structural determination in thin film samples.
Key Features:
- High precision X-ray analysis instrument
- Advanced technology and software enhancements
- Material characterization
- Layer thickness measurement
- Composition analysis
- Structure determination
Advantages:
- Exceptional accuracy and resolution
- Reliable results
- Seamless operation
- Latest technology incorporated
- Enhanced software for data analysis
Product Details
| Model | |
|---|---|
| Product Type | Consumables |
| Part Number | 200335-02 |
| Brand | XOS - X-Ray Optical Systems |
| Gross Dimensions (WxDxH cm) | |
| Net Dimensions (WxDxH cm) | |
| Gross Weight (kg) | |
| Net Weight (kg) |
| Film Thickness | 3 um |
|---|
More options are available. Please contact us for more information.
XOS - X-Ray Optical Systems
XOS is a leading manufacturer of application-specific X-ray analyzers, offering elemental analysis solutions that improve public safety and customer efficiency in industries like petroleum and environmental compliance.
For petroleum applications, XOS offers portable, lab, and process analyzers with unrivaled precision at the push of a button. XOS also offers High Definition XRF (HDXRF®) analyzers for the detection of toxic elements in areas of environmental regulation, like soil and water.
XOS’ advanced optics and OEM sub-systems can increase precision, speed, and spatial resolution, while decreasing the size, complexity, and cost of the instrument.